• Title of article

    In situ TEM investigation of dynamical changes of nanostructures

  • Author/Authors

    Chen، نويسنده , , L.J. and Wu، نويسنده , , W.W.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    17
  • From page
    303
  • To page
    319
  • Abstract
    In situ investigation of the temperature induced phase transformation, structural and chemical evolution of nanocrystals is important for understanding the structure and stability of nanomaterials. Transmission electron microscopy (TEM), one of the most powerful tools for characterizing nanostructured materials, is essential for the development of nanotechnology. In situ TEM is a technique that allows a direct observation of dynamic properties in nanoscale. Recent development of ultra-high vacuum TEM (UHV-TEM) further enables the investigation on atomic-scale materials systems in a clean environment. The appropriate utilization of the UHV-TEM will be beneficial in studying the fundamental mechanisms of dynamic reactions, formation of transient phase, solid-state amorphization, epitaxial growth, growth kinetics and evolution of defects. In this paper, we present the most recent progress in observing dynamic processes in nanoscale by in situ UHV-TEM.
  • Keywords
    Nanostructures , Si bicrystals , Si nanorings , Silicide nanowires , Dynamical changes , Nanothermometry , Cu electromigration , epitaxial growth , In situ TEM
  • Journal title
    Materials Science and Engineering R Reports
  • Serial Year
    2010
  • Journal title
    Materials Science and Engineering R Reports
  • Record number

    2152687