Dislocation structure misorientations measured with an automated electron diffraction pattern indexing tool

The substructures of deformed Fe–1.5%Cu alloys are investigated by use of a transmission electron microscope (TEM). The aspect of the substructure as observed in classical bright-field mode is compared with the average misorientation gradient deduced from orientation maps collected with an automated diffraction pattern indexing tool. It is shown that a significant part of the dislocation boundaries are not detectable through misorientation measurements.