Title of article
Grain boundary segregation of phosphorus and silicon in polycrystals and bicrystals of the Fe–2.6Si–0.055P alloy
Author/Authors
Janovec، نويسنده , , Jozef and Jenko، نويسنده , , Monika and Lej?ek، نويسنده , , Pavel and Pokluda، نويسنده , , Jaroslav، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
5
From page
441
To page
445
Abstract
Grain boundary segregation of phosphorus and silicon was investigated in polycrystals and bicrystals of an Fe–2.6Si–0.055P (wt.%) alloy after annealing at 600 or 800 °C by Auger electron spectroscopy. Lower segregation effects were revealed in bicrystals if compared with polycrystalline samples annealed at the same conditions. Intergranular fracture was found to be enhanced when the grain boundary concentration of phosphorus was increased.
Keywords
Portion of intergranular fracture , Auger electron spectroscopy , Iron-based alloy , polycrystal , Grain boundary segregation , Bicrystal
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2007
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2152742
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