Author/Authors :
Hecht، نويسنده , , B. and Heinzelmann، نويسنده , , H. R. Pohl، نويسنده , , D.W.، نويسنده ,
Abstract :
Aperture scanning near-field optical microscopy (SNOM/NSOM) and scanning tunneling optical microscopy (STOM, also known as PSTM) are integrated into an instrument which combines the advantages of both schemes. As a result, more near-field optical information can be obtained and new modes of operation become possible. Scan images of a glass surface with a fine grating relief demonstrate some of the capabilities of the new ‘TNOM’ technique.
