Title of article :
Simulation of electron holographic contour maps of linear charged dislocations
Author/Authors :
Cavalcoli، نويسنده , , Scott D. and Matteucci، نويسنده , , G. and Muccini، نويسنده , , M.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1995
Pages :
6
From page :
385
To page :
390
Abstract :
The possibility to reveal the electric potential distribution arising from straight charged dislocations in silicon by means of electron holography techniques in the transmission mode is considered. Using the Read model for a charged dislocation two experimental arrangements are investigated with the line charge parallel or perpendicular to the electron beam. Although contour maps should be revealable with both set-ups, it turns out that the second case is more versatile and suitable for displaying the dislocation charge. Beam injection conditions are also discussed.
Journal title :
Ultramicroscopy
Serial Year :
1995
Journal title :
Ultramicroscopy
Record number :
2154314
Link To Document :
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