Title of article
EXELFS χ-data renormalization
Author/Authors
Qian، نويسنده , , Maoxu and Sarikaya، نويسنده , , Mehmet and Stern، نويسنده , , Edward A.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1997
Pages
9
From page
163
To page
171
Abstract
In this paper, a procedure developed for accurate modeling of the background of core edges in electron energy loss spectroscopy (EELS) is described. This procedure is necessary for improving data analysis technique used in extended energy loss fine structure (EXELFS) spectroscopy via the adaptation of X-ray absorption fine structure (XAFS) analysis programs. With the improved background modeling, it now becomes possible to renormalize the EXELFS χ-data and to ensure the correct use of the XAFS programs for EXELFS analysis.
Keywords
Extended energy loss fine structure (EXELFS) spectroscopy , Transmission electron microscopy (TEM) , ?-data , X-ray absorption fine structure (XAFS) analysis , Near neighbor , Debye-Waller factor , Electron energy loss spectroscopy (EELS)
Journal title
Ultramicroscopy
Serial Year
1997
Journal title
Ultramicroscopy
Record number
2154791
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