Determination of crystallographic and macroscopic orientation of planar structures in TEM

With the aid of a double-tilt holder in a transmission electron microscope (TEM), simple methods are described for determination of the crystallographic orientation of a planar structure and for calculation of the macroscopic orientation of the planar structure. The correlation between a planar structure and a crystallographic plane can be found by comparing the differences in their trace directions on the projection plane and inclination angles with respect to that plane. The angles between the traces of planar structures and the sample axis measured from the TEM micrographs, which have been taken at tilted positions, can be transformed to the real macroscopic orientation of the planar structures with estimated error of about ±2°.