Title of article
Overabundant single-particle electron microscope views induce a three-dimensional reconstruction artifact
Author/Authors
Boisset، نويسنده , , Nicolas and Penczek، نويسنده , , Pawel A. and Taveau، نويسنده , , Jean-Christophe and You، نويسنده , , Valérie and de Haas، نويسنده , , Felix and Lamy، نويسنده , , Jean، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1998
Pages
7
From page
201
To page
207
Abstract
In the field of single-particles 3D reconstruction, the development of angular assignment techniques has allowed the collection of a large amount of cryoelectron microscope images of untilted-specimens. When particles have a preferential orientation within the ice layer, one type of electron microscope (EM) view is oversampled and produces a new type of 3D reconstruction artifact. This oversampling artifact is observed with simultaneous iterative reconstruction techniques (SIRT) but the theoretical analysis of the problem indicates that similar effects could also occur with other reconstruction algorithms.
Keywords
Single particle molecular architecture , cryoelectron microscopy , three-dimensional reconstruction
Journal title
Ultramicroscopy
Serial Year
1998
Journal title
Ultramicroscopy
Record number
2155076
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