Title of article
Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements
Author/Authors
Chen، نويسنده , , X. and Davies، نويسنده , , M.C. and Roberts، نويسنده , , C.J. and Tendler، نويسنده , , S.J.B. and Williams، نويسنده , , P.M. and Davies، نويسنده , , J. and Dawkes، نويسنده , , A.C. and Edwards، نويسنده , , J.C.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1998
Pages
11
From page
171
To page
181
Abstract
Vibrating mode force measurements, or amplitude–phase–distance measurements, have been used to experimentally investigate contrast mechanisms in tapping mode atomic force microscopy. Gelatin adsorbed on polystyrene and mica surfaces have been taken as examples to show that the amplitude–phase–distance curves and amplitude–energy loss–distance curves enable the interpretation of artifacts in height images and contrast in phase images. The principles are applicable in general to tapping mode imaging, and are discussed in the context of previously proposed theoretical models, i.e., those based on solution of equations of motion or on energy conservation.
Keywords
Scanning probe microscopy , Methods and techniques , Imaging
Journal title
Ultramicroscopy
Serial Year
1998
Journal title
Ultramicroscopy
Record number
2155103
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