• Title of article

    Advanced spatially resolved EELS in the STEM

  • Author/Authors

    Batson، نويسنده , , P.E، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1999
  • Pages
    10
  • From page
    33
  • To page
    42
  • Abstract
    Commercial availability of high spatial resolution STEM instruments is leading to widespread use of EELS and ADF imaging techniques. Future instruments will need to greatly improve levels of stability and accuracy to allow use of these techniques with atomic level precision. I review some experimental results which suggest an urgent need for a 0.1 nm diameter probe with a usable EELS spectral resolution of about 100 meV.
  • Keywords
    Atomic level analysis , EELS and ADF imaging techniques , STEM instruments
  • Journal title
    Ultramicroscopy
  • Serial Year
    1999
  • Journal title
    Ultramicroscopy
  • Record number

    2155184

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=2155184