Title of article :
Three-dimensional atomic scale microscopy with the atom probe
Author/Authors :
Menand، نويسنده , , A and Cadel، نويسنده , , E and Pareige، نويسنده , , C and Blavette، نويسنده , , D، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1999
Pages :
10
From page :
63
To page :
72
Abstract :
A new type of high resolution nanoanalytical microscope, the three-dimensional atom-probe, has been recently developed. The tomographic atom-probe (TAP) developed in our laboratory provides three-dimensional maps of chemical heterogeneities in a metallic material on a near-atomic scale. The basic principle of this new generation apparatus relies on the field evaporation and ionisation of atoms from the material. Chemical species are identified by time-of-flight mass spectrometry. The position of atoms at the specimen surface is determined with the aid of a specially designed position-sensitive multidetector. In this paper the high spatial resolution of the TAP is illustrated through some metallurgical examples by studying the very early stages of unmixing and ordering reactions and the mapping of interfacial segregations.
Keywords :
Interfacial segregation , 3D atom-probe , Analytical microscopy , Unmixing , long-range order
Journal title :
Ultramicroscopy
Serial Year :
1999
Journal title :
Ultramicroscopy
Record number :
2155188
Link To Document :
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