• Title of article

    Dose-rate dependence of electron-induced mass loss from organic specimens

  • Author/Authors

    Egerton، نويسنده , , R.F and Rauf، نويسنده , , I، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1999
  • Pages
    8
  • From page
    247
  • To page
    254
  • Abstract
    Electron energy-loss measurements on thin films of collodion at low temperatures (90 K) show that the characteristic electron dose De for mass loss first increases and then decreases with increasing dose rate (current density). This behaviour is explained in terms of the limited diffusion rates at low specimen temperature and the heating effect of the electron beam, and can be approximately modelled using a simple computer program. For a small-diameter electron probe, the increase in De can be several orders of magnitude, suggesting a substantial advantage of STEM (in comparison to fixed-beam TEM) for examining beam-sensitive specimens.
  • Keywords
    Radiation effects (experimental) , Electron energy loss spectroscopy (EELS)
  • Journal title
    Ultramicroscopy
  • Serial Year
    1999
  • Journal title
    Ultramicroscopy
  • Record number

    2155315