Title of article
Zero-loss image formation and modified contrast transfer theory in EFTEM
Author/Authors
Angert، نويسنده , , Isabel and Majorovits، نويسنده , , Endre and Schrِder، نويسنده , , Rasmus R، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2000
Pages
20
From page
203
To page
222
Abstract
For a weak phase/weak amplitude object the information transfer in the imaging process of TEM is described by the common formalism of the contrast transfer function (CTF). So far the effects of inelastic scattering were not accounted for in this formalism. In conventional imaging they were simply neglected. In energy filtering TEM (EFTEM), where removal of inelastic electrons leads to higher specimen contrast, they were modelled by a global increase of the elastic amplitude contrast. Thus, the description of inelastic and elastic scattering was mixed. Here a new ansatz is proposed which treats elastic and inelastic contrast transfer separately by adding an inelastic contribution to the scattering potentials. In EFTEM this has the effect of adding a filter contrast which depends on the characteristics of the inelastic scattering. For samples with dominant plasmon loss the additional filter contrast is restricted to low resolution. Because of its strong dependence on the nature of the inelastic scattering process, the filter contrast cannot in general be unified with the conventional elastic amplitude contrast.
dified CTF theory for EFTEM was tested experimentally on a variety of samples. Images of amorphous layers of copper, aluminium, and carbon films, as well as zero-loss images of proteins embedded in amorphous ice were evaluated. The values of the parameters of the additional filter contrast were determined for carbon film and proteins embedded in vitrified ice. Comparison of different CTF models used to reconstruct 3D volumes from zero-loss images confirmed that best agreement with the atomic model is attained with the new, modified CTF theory.
Keywords
Zero-loss imaging , EFTEM , CTF , Filter contrast
Journal title
Ultramicroscopy
Serial Year
2000
Journal title
Ultramicroscopy
Record number
2155345
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