• Title of article

    The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic–ceramic composites

  • Author/Authors

    Knowles، نويسنده , , Kevin M. and Turan، نويسنده , , Servet، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2000
  • Pages
    15
  • From page
    245
  • To page
    259
  • Abstract
    High-resolution transmission electron microscope observations of hexagonal boron nitride – 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally.
  • Keywords
    High-resolution transmission electron microscopy (HRTEM) , Interfaces , ceramics , Hamaker constant , Dispersion forces , Thin films
  • Journal title
    Ultramicroscopy
  • Serial Year
    2000
  • Journal title
    Ultramicroscopy
  • Record number

    2155466