Title of article
The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic–ceramic composites
Author/Authors
Knowles، نويسنده , , Kevin M. and Turan، نويسنده , , Servet، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2000
Pages
15
From page
245
To page
259
Abstract
High-resolution transmission electron microscope observations of hexagonal boron nitride – 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally.
Keywords
High-resolution transmission electron microscopy (HRTEM) , Interfaces , ceramics , Hamaker constant , Dispersion forces , Thin films
Journal title
Ultramicroscopy
Serial Year
2000
Journal title
Ultramicroscopy
Record number
2155466
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