Title of article :
The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic–ceramic composites
Author/Authors :
Knowles، نويسنده , , Kevin M. and Turan، نويسنده , , Servet، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2000
Abstract :
High-resolution transmission electron microscope observations of hexagonal boron nitride – 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally.
Keywords :
High-resolution transmission electron microscopy (HRTEM) , Interfaces , ceramics , Hamaker constant , Dispersion forces , Thin films
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy