• Title of article

    Determination of the orientation in small areas of the exit wave

  • Author/Authors

    Bokel، نويسنده , , R.M.J. and Jansen، نويسنده , , J and Zandbergen، نويسنده , , H.W، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2001
  • Pages
    8
  • From page
    89
  • To page
    96
  • Abstract
    Local differences in thickness and misorientation in a through-focus reconstructed exit wave hamper direct interpretation. These local thicknesses and misorientations can be refined on an atomic scale using the intensities of the Fourier components with the refinement procedure in which a least-squares refinement is combined with a multi-slice calculation. The method was applied to the superconductor La3Ni2B2N3. The crystal tilt and specimen thickness can be determined with an R-value of 8–25%, with a better R-value for thinner areas. Significant differences in the refined tilts, thicknesses and R-values are observed when reconstructed exit waves that are corrected for mechanical vibration are compared with reconstructed exit waves, which are uncorrected.
  • Keywords
    high-resolution transmission electron microscopy , Exit-wave reconstruction , Electron microscope design and characterisation
  • Journal title
    Ultramicroscopy
  • Serial Year
    2001
  • Journal title
    Ultramicroscopy
  • Record number

    2155621