Title of article :
Interaction forces and conduction properties between multi wall carbon nanotube tips and Au(1 1 1)
Author/Authors :
Luna، نويسنده , , M. and de Pablo، نويسنده , , P.J. and Colchero، نويسنده , , J. and Gomez-Herrero، نويسنده , , J. and Baro، نويسنده , , A.M. and Tokumoto، نويسنده , , H. and Jarvis، نويسنده , , S.P.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2003
Pages :
10
From page :
83
To page :
92
Abstract :
We have studied the interaction forces and electrical conduction properties arising between multiwall carbon nanotube tips and the Au(1 1 1) surface in air, by means of amplitude modulation scanning force microscopy, also called intermittent contact. We have centered our work on tips with metallic electronic structure and for the specific parameters used we have found a preliminary interaction range where there is no contact between tip and surface. Stable imaging in this non-contact range is possible with multiwall carbon nanotube tips. These tips have also been used to obtain simultaneous topographic and current maps of the surface. They show excellent properties as tips due to their high aspect ratio and durability, as a result of their elastic and non-reactive properties. Correspondingly, multiwall carbon nanotube tips allow high resolution local analysis of electrical conductivity on a nanometer scale.
Keywords :
AFM , SFM , Interaction forces , Non-contact , MCNT , Conductivity
Journal title :
Ultramicroscopy
Serial Year :
2003
Journal title :
Ultramicroscopy
Record number :
2155969
Link To Document :
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