Title of article
Automated image processing for grain boundary analysis
Author/Authors
Mahadevan، نويسنده , , Sowmya and Casasent، نويسنده , , David، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2003
Pages
10
From page
153
To page
162
Abstract
The image processing used in the automated analysis of grain boundaries and triple junctions in scanning electron microscopy images is described. The required image processing includes the location of grain boundaries and triple junctions, calculation of the dihedral angles at triple junctions, and selection of electron backscatter probe points (to obtain grain orientation data).
Keywords
Triple junction , Orientation imaging microscopy , Grain boundary , Electron backscatter pattern
Journal title
Ultramicroscopy
Serial Year
2003
Journal title
Ultramicroscopy
Record number
2155980
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