Title of article
Localization in elastic and inelastic scattering
Author/Authors
Lupini، نويسنده , , A.R. and Pennycook، نويسنده , , S.J.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2003
Pages
10
From page
313
To page
322
Abstract
The degree of information localization in elastic and inelastic scattering is examined in the context of imaging zone axis crystals in the aberration corrected STEM. We show that detector geometry is a critical factor in determining the localization, and compare a number of different geometries. Experimental core loss line traces demonstrate strong EELS localization at the titanium L-edge, even in the presence of dynamical elastic scattering.
Keywords
eels , localization , Delocalization , COHERENCE , STEM , Aberration , Cs-correction
Journal title
Ultramicroscopy
Serial Year
2003
Journal title
Ultramicroscopy
Record number
2156001
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