Title of article
Calibration of AFM cantilever spring constants
Author/Authors
Gibson، نويسنده , , Christopher T. and Weeks، نويسنده , , Brandon L. and Abell، نويسنده , , Chris and Rayment، نويسنده , , Trevor and Myhra، نويسنده , , Sverre، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2003
Pages
6
From page
113
To page
118
Abstract
In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Youngʹs modulus, density of the cantilever and resonant frequency. The thickness of thin gold layers was determined by measuring changes in the resonant frequency and Q-factor of beam shaped AFM cantilevers before and after coating.
chniques for measuring the spring constant and thin film thickness provide accuracy on the order of 10–15%.
Keywords
Q-factor , Cantilever , Resonant frequency and spring constant
Journal title
Ultramicroscopy
Serial Year
2003
Journal title
Ultramicroscopy
Record number
2156064
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