Title of article :
Compensation of charging in X-PEEM: a successful test on mineral inclusions in 4.4 Ga old zircon
Author/Authors :
De Stasio، نويسنده , , Gelsomina and Frazer، نويسنده , , Bradley H. and Gilbert، نويسنده , , Benjamin and Richter، نويسنده , , Katherine L. and Valley، نويسنده , , John W.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2003
Abstract :
We present a new differential-thickness coating technique to analyze insulating samples with X-ray PhotoElectron Emission spectroMicroscopy (X-PEEM). X-PEEM is non-destructive, analyzes the chemical composition and crystal structure of minerals and can spatially resolve chemical species with a resolution presently reaching 35 nm. We tested the differential coating by analyzing a 4.4 billion-year-old zircon (ZrSiO4) containing silicate inclusions. We observed quartz (SiO2) inclusions smaller than 1 μm in size that can only be analyzed non-destructively with synchrotron spectromicroscopies. With the removal of charging we greatly extend the range of samples that can be analyzed by X-PEEM.
Keywords :
X-ray microscopy , etc.) , Microscopic defects (voids , Instrumentation and techniques for geophysical analysis , X-ray absorption spectra , inclusions
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy
