• Title of article

    Model based quantification of EELS spectra

  • Author/Authors

    Verbeeck، نويسنده , , J. and Van Aert، نويسنده , , S.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2004
  • Pages
    18
  • From page
    207
  • To page
    224
  • Abstract
    Recent advances in model based quantification of electron energy loss spectra (EELS) are reported. The maximum likelihood method for the estimation of physical parameters describing an EELS spectrum, the validation of the model used in this estimation procedure, and the computation of the attainable precision, that is, the theoretical lower bound on the variance of these estimates, are discussed. Experimental examples on Au and GaAs samples show the power of the maximum likelihood method and show that the theoretical prediction of the attainable precision can be closely approached even for spectra with overlapping edges where conventional EELS quantification fails. To provide end-users with a low threshold alternative to conventional quantification, a user friendly program was developed which is freely available under a GNU public license.
  • Keywords
    eels , Quantification , Precision , model , Maximum likelihood , fitting
  • Journal title
    Ultramicroscopy
  • Serial Year
    2004
  • Journal title
    Ultramicroscopy
  • Record number

    2156256