A further discussion on the peculiarity of maximum entropy image deconvolution in HREM

Some important features observed in the maximum entropy image deconvolution in HREM were studied and demonstrated as a supplement to previous publications in Ultramicroscopy 35 (1991) 339 and 62 (1996) 141. It has been shown that in the process of image deconvolution how the errors of assigned electron-optical parameters can be compensated and the effect of crystal thickness can be corrected. The ‘negative-potential problem’ has been solved more perfectly than before via the normalization of sum total entropy.