• Title of article

    JECP/PCED—a computer program for simulation of polycrystalline electron diffraction pattern and phase identification

  • Author/Authors

    Li، نويسنده , , X.Z.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2004
  • Pages
    5
  • From page
    257
  • To page
    261
  • Abstract
    A computer program for simulation of polycrystalline electron diffraction pattern and phase identification is described. In addition to simulating electron diffraction pattern for a single phase, the program has the ability to model two phases with selected mass ratio. Experimental polycrystalline electron diffraction patterns can be directly compared to simulated patterns for phase identification. Examples of how to use the program are also given.
  • Keywords
    Electron diffraction , Polycrystalline phase , Computer software
  • Journal title
    Ultramicroscopy
  • Serial Year
    2004
  • Journal title
    Ultramicroscopy
  • Record number

    2156370