Title of article :
Error tolerance of an iterative phase retrieval algorithm for moveable illumination microscopy
Author/Authors :
Faulkner، نويسنده , , H.M.L. and Rodenburg، نويسنده , , J.M.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2005
Pages :
12
From page :
153
To page :
164
Abstract :
This paper examines the behaviour of the new Ptychographical Iterative Engine (PIE) algorithm when part of the initial information it requires is inaccurately known. This could be the parameters describing the illuminating wavefunction, the precise location of the specimen relative to the illuminating wavefunction, or other information that is assumed about the physical system. The tolerance of the algorithm for unavoidable problems such as noise and source incoherence is also investigated, leading to the conclusion that this approach to phase retrieval is very robust. It can not only tolerate errors in the assumed parameters, but can often be used as a method of characterising the parameters more accurately.
Keywords :
X-ray microscopy , phase retrieval , Iterative algorithms , Electron microscopy , Ptychography
Journal title :
Ultramicroscopy
Serial Year :
2005
Journal title :
Ultramicroscopy
Record number :
2156442
Link To Document :
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