• Title of article

    Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example

  • Author/Authors

    Van Aert، نويسنده , , S. and den Dekker، نويسنده , , A.J. and van den Bos، نويسنده , , A. and Van Dyck، نويسنده , , D. and Chen، نويسنده , , J.H.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2005
  • Pages
    19
  • From page
    107
  • To page
    125
  • Abstract
    This paper is the second part of a two-part paper on maximum likelihood (ML) estimation of structure parameters from electron microscopy images. In order to show the practical applicability of the theoretical methods described in the first part of this two-part paper, an experimental study of an aluminium crystal is presented. In this study, structure parameters, atom column distances in particular, are estimated from high-resolution transmission electron microscopy (HRTEM) images using the ML method. The necessary steps to be made in the application of this method will be worked out one by one, including model assessment, the computation of the ML parameter estimates, and the construction of confidence intervals for these parameter estimates.
  • Keywords
    High resolution transmission electron microscopy (HRTEM) , General methods in microscopy , Electron microscope design and characterization , Data processing , image processing , tools
  • Journal title
    Ultramicroscopy
  • Serial Year
    2005
  • Journal title
    Ultramicroscopy
  • Record number

    2156487