Title of article
Surface morphology of self-assembled vertically stacked InAs quantum dots by atomic force microscopy
Author/Authors
Li، نويسنده , , Shuwei and Koike، نويسنده , , Kazuto، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2005
Pages
4
From page
125
To page
128
Abstract
In quantum dots (QDs) three-dimensional confinement of carriers leads to energy level discreteness to exhibit a rich spectrum of phenomena including quantum confinement, exchange splittings, Coulomb blockade, and multiexciton transitions. In this paper, five-period vertically stacked samples with size-controlled growth were grown by molecular-beam epitaxy (MBE) with solid sources, and the surface morphologies of self-assembled vertically stacked InAs quantum dots were characterized by atomic force microscopy (AFM). We described structural and optical properties of vertically aligned InAs QDs embedded in Al0.5Ga0.5As and employed a size-controlled growth procedure for the QDs. The strongly localized electron coupling effect and many-body effect lead to quantum dephase splitting of the ground state energy of the vertically aligned InAs QDs.
Keywords
Quantum dots , Quantum dephase , atomic force microscopy , Molecular-beam epitaxy
Journal title
Ultramicroscopy
Serial Year
2005
Journal title
Ultramicroscopy
Record number
2156551
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