• Title of article

    Surface morphology of self-assembled vertically stacked InAs quantum dots by atomic force microscopy

  • Author/Authors

    Li، نويسنده , , Shuwei and Koike، نويسنده , , Kazuto، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2005
  • Pages
    4
  • From page
    125
  • To page
    128
  • Abstract
    In quantum dots (QDs) three-dimensional confinement of carriers leads to energy level discreteness to exhibit a rich spectrum of phenomena including quantum confinement, exchange splittings, Coulomb blockade, and multiexciton transitions. In this paper, five-period vertically stacked samples with size-controlled growth were grown by molecular-beam epitaxy (MBE) with solid sources, and the surface morphologies of self-assembled vertically stacked InAs quantum dots were characterized by atomic force microscopy (AFM). We described structural and optical properties of vertically aligned InAs QDs embedded in Al0.5Ga0.5As and employed a size-controlled growth procedure for the QDs. The strongly localized electron coupling effect and many-body effect lead to quantum dephase splitting of the ground state energy of the vertically aligned InAs QDs.
  • Keywords
    Quantum dots , Quantum dephase , atomic force microscopy , Molecular-beam epitaxy
  • Journal title
    Ultramicroscopy
  • Serial Year
    2005
  • Journal title
    Ultramicroscopy
  • Record number

    2156551