• Title of article

    Electron diffraction analysis of individual single-walled carbon nanotubes

  • Author/Authors

    Meyer، نويسنده , , Jannik C. and Paillet، نويسنده , , Matthieu and Duesberg، نويسنده , , Georg S. and Roth، نويسنده , , Siegmar، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2006
  • Pages
    15
  • From page
    176
  • To page
    190
  • Abstract
    We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60 kV , below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects.
  • Keywords
    Nanotube and TEM sample preparation , Electron diffraction , Carbon nanotubes
  • Journal title
    Ultramicroscopy
  • Serial Year
    2006
  • Journal title
    Ultramicroscopy
  • Record number

    2156628