Title of article
High resolution non-contact AFM imaging of liquids condensed onto chemically nanopatterned surfaces
Author/Authors
Paolo Checco، نويسنده , , Antonio and Cai، نويسنده , , Yuguang and Gang، نويسنده , , Oleg and Ocko، نويسنده , , Benjamin M.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2006
Pages
6
From page
703
To page
708
Abstract
The wetting of ethanol and octane on chemically nanopatterned surfaces has been investigated using Atomic Force Microscopy (AFM) under controlled environmental conditions. The patterns were generated on a methyl-terminated, organic monolayer using an AFM electro-oxidation process. The subsequent wetting of the organic liquids was studied using non-contact mode AFM under equilibrium conditions with the vapor. This study of condensed nanoliquids provides the first reliable measurements of sub 100 nm liquid profile shapes. The derived contact angles give an estimate of the line tension.
Keywords
Non-contact AFM , Wetting , Liquids , Contact angle , Line tension , Chemical patterns , Self-assembled monolayers
Journal title
Ultramicroscopy
Serial Year
2006
Journal title
Ultramicroscopy
Record number
2156728
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