Title of article :
Cantilever dynamics and quality factor control in AC mode AFM height measurements
Author/Authors :
Chen، نويسنده , , Liwei and Yu، نويسنده , , Xuechun and Wang، نويسنده , , Dan، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2007
Pages :
6
From page :
275
To page :
280
Abstract :
We show that inconsistent-imaging dynamics, in which the cantilever oscillates in the attractive regime on substrate background but in the repulsive regime on sample, leads to artifacts in apparent height in AC mode Atomic force microscopy. Active Q control can be used to effectively tune the imaging dynamics. Increased effective Q promotes the attractive regime, improves imaging sensitivity, and results in less invasive imaging of soft biological molecules.
Keywords :
Atomic force microscopy (AFM)
Journal title :
Ultramicroscopy
Serial Year :
2007
Journal title :
Ultramicroscopy
Record number :
2156857
Link To Document :
بازگشت