Title of article
Investigation of CdS thin films by a near-field microwave microprobe
Author/Authors
Sargsyan، نويسنده , , Tigran and Hovsepyan، نويسنده , , Artur and Melikyan، نويسنده , , Harutyun and Yoon، نويسنده , , Youngwoon and Lee، نويسنده , , Huneung and Babajanyan، نويسنده , , Arsen and Kim، نويسنده , , Mijung and Cha، نويسنده , , Deokjoon and Lee، نويسنده , , Kiejin، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2008
Pages
4
From page
1062
To page
1065
Abstract
Cadmium sulphide (CdS) thin films with different microstructures and morphologies were measured by using a near-field microwave microprobe (NFMM). The NFMM system was coupled to a dielectric resonator with a distance regulation system at an operating frequency f=4.1 GHz. The changes in dielectric permittivity of CdS thin films due to different annealing temperatures were investigated by measuring the reflection coefficient S11. CdS thin films with different microstructures and morphology were characterized by X-ray diffraction, atomic force microscopy and NFMM.
Keywords
CDS , Microwave microprobe , Annealing , Near-Field
Journal title
Ultramicroscopy
Serial Year
2008
Journal title
Ultramicroscopy
Record number
2157273
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