Title of article
Effect of amorphous layers on the interpretation of restored exit waves
Author/Authors
Aert، نويسنده , , S. Van and Chang، نويسنده , , L.Y. and Bals، نويسنده , , S. J. Kirkland، نويسنده , , A.I. and Tendeloo، نويسنده , , G. Van، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2009
Pages
10
From page
237
To page
246
Abstract
The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of 〈 0 0 1 〉 SrTiO 3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.
Keywords
High-resolution transmission electron microscopy (HRTEM) , Exit wave restoration , Model-based fitting
Journal title
Ultramicroscopy
Serial Year
2009
Journal title
Ultramicroscopy
Record number
2157494
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