• Title of article

    Effect of amorphous layers on the interpretation of restored exit waves

  • Author/Authors

    Aert، نويسنده , , S. Van and Chang، نويسنده , , L.Y. and Bals، نويسنده , , S. J. Kirkland، نويسنده , , A.I. and Tendeloo، نويسنده , , G. Van، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2009
  • Pages
    10
  • From page
    237
  • To page
    246
  • Abstract
    The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of 〈 0 0 1 〉 SrTiO 3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.
  • Keywords
    High-resolution transmission electron microscopy (HRTEM) , Exit wave restoration , Model-based fitting
  • Journal title
    Ultramicroscopy
  • Serial Year
    2009
  • Journal title
    Ultramicroscopy
  • Record number

    2157494