• Title of article

    Exploration of the ultimate patterning potential achievable with focused ion beams

  • Author/Authors

    Gierak، نويسنده , , J. and Bourhis، نويسنده , , E. and Faini، نويسنده , , G. and Patriarche، نويسنده , , G. and Madouri، نويسنده , , A. and Jede، نويسنده , , R. and Bruchhaus، نويسنده , , L. and Bauerdick، نويسنده , , S. and Schiedt، نويسنده , , B. and Biance، نويسنده , , A.L. and Auvray، نويسنده , , L.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2009
  • Pages
    6
  • From page
    457
  • To page
    462
  • Abstract
    Decisive advances in the field of nanosciences and nanotechnologies are intimately related to the development of new instruments and of related writing schemes and methodologies. Therefore we have recently proposed the exploitation of the nano-structuring potential of a highly focused ion beam (FIB) as a tool, to overcome intrinsic limitations of current nano-fabrication techniques and to allow innovative patterning schemes that are urgently needed in many nanoscience challenges. In this work, we will first detail a very high-resolution FIB instrument we have developed specifically to meet these nano-fabrication requirements. Then we will introduce and illustrate an advanced FIB processing scheme that is the fabrication of artificial nanopores.
  • Keywords
    Nano-patterning , Focused ion beam , SiC membrane , nanopore
  • Journal title
    Ultramicroscopy
  • Serial Year
    2009
  • Journal title
    Ultramicroscopy
  • Record number

    2157544