• Title of article

    Laser-assisted atom probe analysis of sol–gel silica layers

  • Author/Authors

    Gruber، نويسنده , , M. and Oberdorfer، نويسنده , , C. and Stender، نويسنده , , P. and Schmitz، نويسنده , , G.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2009
  • Pages
    6
  • From page
    654
  • To page
    659
  • Abstract
    Semi-conducting nanocrystals embedded in a non-conducting matrix of silicate glass may be used as non-volatile data storage device. Structures of silicate glasses are conveniently produced by a sol–gel process, which offers the possibility to coat tip-shaped substrates with a silica layer. The study presents first results of their local chemical analysis by laser-assisted atom probe. Till date the exact mechanisms of laser pulsing are still controversial. But it is common sense that there is an at least considerable heating effect on the tip, which leads to a short temperature rise and a prolonged cooling period in materials of low heat conductivity. This effect alters the shape of mass peaks and is examined here using a one-dimensional model of heat transport.
  • Keywords
    Sol–gel process , silica , Laser pulsing , Atom probe tomography
  • Journal title
    Ultramicroscopy
  • Serial Year
    2009
  • Journal title
    Ultramicroscopy
  • Record number

    2157594