Title of article
Comments on the paper “Bragg’s law diffraction simulations for electron backscatter diffraction analysis” by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood
Author/Authors
Maurice، نويسنده , , Claire and Fortunier، نويسنده , , Roland and Driver، نويسنده , , Julian and Day، نويسنده , , Austin and Mingard، نويسنده , , Ken and Meaden، نويسنده , , Graham، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2010
Pages
2
From page
758
To page
759
Abstract
This comment on the paper "Braggʹs Law diffraction simulations for electron backscatter diffraction analysis" by Kacher et al. explains the limitations in determining elastic strains using synthetic EBSD patterns.
ticular importance are those due to the accuracy of determination of the EBSD geometry projection parameters. Additional references and supporting information are provided.
Keywords
Calibration , EBSD , strain , Scanning electron microscope
Journal title
Ultramicroscopy
Serial Year
2010
Journal title
Ultramicroscopy
Record number
2157926
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