Author/Authors :
Schmidt، نويسنده , , Th. and Marchetto، نويسنده , , H. and Lévesque، نويسنده , , P.L. and Groh، نويسنده , , U. and Maier، نويسنده , , F. and Preikszas، نويسنده , , Bradley D. and Hartel، نويسنده , , P. and Spehr، نويسنده , , R. and Lilienkamp، نويسنده , , Klaus G. and Engel، نويسنده , , W. and Fink، نويسنده , , R. and Bauer، نويسنده , , E. and Rose، نويسنده , , Scott H. and Umbach، نويسنده , , Edwin E. and Freund، نويسنده , , H.-J.، نويسنده ,
Abstract :
The lateral resolution of a surface sensitive low-energy electron microscope (LEEM) has been improved below 4 nm for the first time. This breakthrough has only been possible by simultaneously correcting the unavoidable spherical and chromatic aberrations of the lens system. We present an experimental criterion to quantify the aberration correction and to optimize the electron optical system. The obtained lateral resolution of 2.6 nm in LEEM enables the first surface sensitive, electron microscopic observation of the herringbone reconstruction on the Au(1 1 1) surface.
