• Title of article

    Investigation for recrystallization behavior of shot peened layer on TiB2/6351Al composite using X-ray diffraction

  • Author/Authors

    Luan، نويسنده , , Weizhi and Jiang، نويسنده , , Chuanhai and Wang، نويسنده , , Haowei، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    4
  • From page
    36
  • To page
    39
  • Abstract
    Using X-ray diffraction line profile analysis (XRDLPA), the recrystallization behaviors of TiB2/6351Al and 6351Al deformation layers introduced by shot peening (SP) have been investigated during isothermal annealing. The recrystallization activation energies of both materials were obtained by regression analysis. The results showed that the recrystallization activation energy of the composite is slightly higher than the alloyʹs one. Reinforcements had two effects on the recrystallization behavior: (1) promoting recrystallization at the early stage of annealing and (2) impeding the movements of grain and subgrain boundaries. The combination of the two opposite effects together with the lower volume of reinforcements and their inhomogeneous distributions weakened the influence of reinforcements on the recrystallization activation energy.
  • Keywords
    Recrystallization , XRD line profile analysis , Composite , Microstructures , Activation energy
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Serial Year
    2008
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Record number

    2158108