Title of article
Investigation for recrystallization behavior of shot peened layer on TiB2/6351Al composite using X-ray diffraction
Author/Authors
Luan، نويسنده , , Weizhi and Jiang، نويسنده , , Chuanhai and Wang، نويسنده , , Haowei، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
4
From page
36
To page
39
Abstract
Using X-ray diffraction line profile analysis (XRDLPA), the recrystallization behaviors of TiB2/6351Al and 6351Al deformation layers introduced by shot peening (SP) have been investigated during isothermal annealing. The recrystallization activation energies of both materials were obtained by regression analysis. The results showed that the recrystallization activation energy of the composite is slightly higher than the alloyʹs one. Reinforcements had two effects on the recrystallization behavior: (1) promoting recrystallization at the early stage of annealing and (2) impeding the movements of grain and subgrain boundaries. The combination of the two opposite effects together with the lower volume of reinforcements and their inhomogeneous distributions weakened the influence of reinforcements on the recrystallization activation energy.
Keywords
Recrystallization , XRD line profile analysis , Composite , Microstructures , Activation energy
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2008
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2158108
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