Title of article :
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser
Author/Authors :
Li، نويسنده , , F. and Ohkubo، نويسنده , , T. and Chen، نويسنده , , Y.M. and Kodzuka، نويسنده , , M. and Hono، نويسنده , , K.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2011
Abstract :
We have investigated the irradiation conditions of femtosecond laser pulses for quantitative atom probe analyses of rare-earth (RE) doped ceria. The influence of laser wavelength, power, pulse frequency, as well as specimen temperature on mass resolution and background noise of atom probe mass spectra were investigated. Furthermore, quantitative atom probe analysis of yttrium distribution in Y-doped ceria was carried out with the optimized evaporation conditions. The distribution of yttrium was found to be uniform within the grains, but they were confirmed to be segregated at grain boundaries.
Keywords :
Femtosecond laser , Laser assisted atom probe , Rare-earth doped ceria
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy