Title of article
Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope
Author/Authors
Cantu-Valle، نويسنده , , Jesus and Ruiz-Zepeda، نويسنده , , Francisco and Mendoza-Santoyo، نويسنده , , Fernando and Jose-Yacaman، نويسنده , , Miguel and Ponce-de-Leَn، نويسنده , , Arturo، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2014
Pages
7
From page
44
To page
50
Abstract
In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35 nm to 2.5 μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.
Keywords
Metallic nanoparticles , Electron holography , Dual-lens imaging , Electron optics , Phase reconstruction
Journal title
Ultramicroscopy
Serial Year
2014
Journal title
Ultramicroscopy
Record number
2159370
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