Semi-automated characterization of the phase in Ni-based superalloys via high-resolution backscatter imaging

The size distribution and volume fraction of the γ ′ phase in Ni-based superalloys plays a critical role in microstructural evolution and mechanical properties. Automated analysis of images is often desired for rapid quantitative characterization of these microstructures. Backscatter electron imaging of specimens in which the γ ′ phase has been selectively etched yields images that can be more readily segmented with image processing algorithms than other imaging techniques. Utilization of this combination of sample preparation and imaging technique allows for the rapid collection of microstructural data.