Title of article
The effect of impurity level on ultrafine-grained microstructures and their stability in low stacking fault energy silver
Author/Authors
Heged?s، نويسنده , , Zolt?n and Gubicza، نويسنده , , Jen? and Kawasaki، نويسنده , , Megumi and Chinh، نويسنده , , Nguyen Q. and Fogarassy، نويسنده , , Zsolt and Langdon، نويسنده , , Terence G.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2011
Pages
6
From page
8694
To page
8699
Abstract
The effect of impurity content on the evolution of microstructure in low stacking fault energy silver processed by severe plastic deformation (SPD) was studied. The SPD-processing was carried out on 4N5 and 4N purity Ag samples by equal-channel angular pressing (ECAP) up to 16 passes. It was found that, although the minimum grain size and the maximum dislocation density were not affected by the different impurity atom content, there is a lower degree of twinning in the less pure material for high number of passes. The small increase of impurity level from 4N5 to 4N in Ag resulted in a significantly better thermal stability at room temperature for the ultrafine-grained microstructures obtained by ECAP.
Keywords
Equal-channel angular pressing , silver , Stacking fault energy , thermal stability , Severe plastic deformation
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2011
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2165071
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