• Title of article

    The microstructural basis for the mechanical properties and electrical resistivity of nanocrystalline Cu–Al2O3

  • Author/Authors

    Nachum، نويسنده , , S. and Fleck، نويسنده , , N.A. and Ashby، نويسنده , , M.F. and Colella، نويسنده , , A. and Matteazzi، نويسنده , , P.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    7
  • From page
    5065
  • To page
    5071
  • Abstract
    The mechanical properties and electrical resistivity of nanocrystalline copper reinforced by 1 vol.% and 5 vol.% of nano-alumina particles have been measured. The composites were prepared by ball-milling and consolidated by a combination of hot extrusion and HIPing. The uniaxial tensile and compressive strengths are comparable for each composite, and an elastic, ideally plastic response is observed. Shear bands, of width a few microns, accompany plastic deformation. A number of microstructural characterisation tools were used to reveal that grain boundary strengthening and dispersion strengthening are the dominant strengthening mechanisms. Nano-indentation measurements reveal a size effect in hardness. The electrical resistivity is almost double that of pure oxygen free copper and this is mainly ascribed to the presence of dissolved iron.
  • Keywords
    Nanocrystalline alloys , dispersion strengthening , Electrical resistivity , Nano-indentation , shear Bands
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Serial Year
    2010
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Record number

    2166338