Title of article
The microstructural basis for the mechanical properties and electrical resistivity of nanocrystalline Cu–Al2O3
Author/Authors
Nachum، نويسنده , , S. and Fleck، نويسنده , , N.A. and Ashby، نويسنده , , M.F. and Colella، نويسنده , , A. and Matteazzi، نويسنده , , P.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
7
From page
5065
To page
5071
Abstract
The mechanical properties and electrical resistivity of nanocrystalline copper reinforced by 1 vol.% and 5 vol.% of nano-alumina particles have been measured. The composites were prepared by ball-milling and consolidated by a combination of hot extrusion and HIPing. The uniaxial tensile and compressive strengths are comparable for each composite, and an elastic, ideally plastic response is observed. Shear bands, of width a few microns, accompany plastic deformation. A number of microstructural characterisation tools were used to reveal that grain boundary strengthening and dispersion strengthening are the dominant strengthening mechanisms. Nano-indentation measurements reveal a size effect in hardness. The electrical resistivity is almost double that of pure oxygen free copper and this is mainly ascribed to the presence of dissolved iron.
Keywords
Nanocrystalline alloys , dispersion strengthening , Electrical resistivity , Nano-indentation , shear Bands
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2010
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2166338
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