• Title of article

    Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti–6Al–4V alloy

  • Author/Authors

    Castany، نويسنده , , P. and Legros، نويسنده , , M.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2011
  • Pages
    5
  • From page
    1367
  • To page
    1371
  • Abstract
    The in situ tensile straining of cross-sectional specimens inside a TEM is intrinsically very difficult to perform despite its obvious interest to study interfaces of surface treated materials. We have combined a FIB-based method to produce H-bar specimens of a nitrided Ti–6Al–4V alloy and in situ TEM straining stage, to successfully study the plastic deformation mechanisms that are activated close to the nitrided surface in the Ti-based alloy.
  • Keywords
    In situ straining , Transmission electron microscopy (TEM) , Nitridation , Focused ion beam (FIB) , dislocation dynamics , Titanium alloy
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Serial Year
    2011
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Record number

    2167230