Title of article :
Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti–6Al–4V alloy
Author/Authors :
Castany، نويسنده , , P. and Legros، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Abstract :
The in situ tensile straining of cross-sectional specimens inside a TEM is intrinsically very difficult to perform despite its obvious interest to study interfaces of surface treated materials. We have combined a FIB-based method to produce H-bar specimens of a nitrided Ti–6Al–4V alloy and in situ TEM straining stage, to successfully study the plastic deformation mechanisms that are activated close to the nitrided surface in the Ti-based alloy.
Keywords :
In situ straining , Transmission electron microscopy (TEM) , Nitridation , Focused ion beam (FIB) , dislocation dynamics , Titanium alloy
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Journal title :
MATERIALS SCIENCE & ENGINEERING: A