Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT

Absolute values of the column densities [ ρ t ] c of four gold foils were measured using micrometry combined with the 2D X-ray attenuation profile. The absolute calibration of [ ρ t ] c was made with a reference foil and the [ ρ t ] c of other foils were determined following the thickness transfer method. By this method, we obtain absolute calibration to 0.1% or better which was not possible using only the X-ray map of a single foil over its central region.