A single-crystal X-ray diffractometer for white synchrotron radiation with solid state detectors: Energy dispersive Laue (EDL) instrument at HASYLAB, Hamburg/Germany

A new instrument for X-ray diffraction offers the use of “white” synchrotron radiation on a small sample producing a Laue pattern and selecting parts of the spectrum for sending reflections into two energy dispersive detectors. Integrated Bragg intensities of up to 20 “harmonics” are obtained simultaneously. The sample is mounted on a Kappa goniometer with a lot of angular space around it for controlling special environments. Possibilities are provided for energy dependent polarization monitoring, for fine adjustment of the diffractometer, and for installing different monochromators and auxiliary equipment for limiting unwanted fluorescence and other background. The EDL diffractometer is controlled via CAMAC by a PC which also handles collecting as well as reduction of data. A number of applications are mentioned and partly demonstrated by test results.