Title of article :
Characterization of lead iodide for nuclear spectrometers
Author/Authors :
Schlesinger، نويسنده , , T.E and James، نويسنده , , R.B and Schieber، نويسنده , , M and Toney، نويسنده , , J and Van Scyoc، نويسنده , , J.M and Salary، نويسنده , , L and Hermon، نويسنده , , H and Lund، نويسنده , , J and Burger، نويسنده , , A and Chen، نويسنده , , K.-T and Cross، نويسنده , , E and Soria، نويسنده , , E and Shah، نويسنده , , K and Squillante، نويسنده , , M and Yoon، نويسنده , , H and Goorsky، نويسنده , , M، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
5
From page :
193
To page :
197
Abstract :
We report on the results of a number of investigations into the material properties of lead iodide and their relation to x- and gamma-ray spectrometers. The effectiveness of zone refining as determined by inductively coupled plasma optical emission spectroscopy is demonstrated. We show that zone refining is effective in producing lead iodide with a higher degree of purity in terms of extrinsic dopants and we determine the segregation coefficients for a number of these impurities. Low temperature photoluminescence also indicates an improvement in the material properties of the purified lead iodide. The chemical etching characteristics, including etch rates, of lead iodide are presented for a number of etching solutions. Triple axis x-ray diffraction measurements have been employed to determine the structural perfection of the lead iodide after diamond sawing and etching and recovery of the crystallinity of the material is seen after Nal etching.
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
1996
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2173714
Link To Document :
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