Title of article :
Creep deformation of a sixth generation Ni-base single crystal superalloy at 800 °C
Author/Authors :
Yuan، نويسنده , , Y. and Kawagishi، نويسنده , , K. and Koizumi، نويسنده , , Y. and Kobayashi، نويسنده , , T. and Yokokawa، نويسنده , , T. and Harada، نويسنده , , H.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
6
From page :
95
To page :
100
Abstract :
The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800 °C and 735 MPa along [001]. TMS-238 had a creep time more than sixty times longer than MX-4/PWA 1497. Microstructural observations showed that stacking faults (SFs) sheared both the γ matrix and γ΄ precipitates in MX-4/PWA 1497, however, SFs sheared only the γ matrix in TMS-238. The factors that affect the creep deformation are discussed. The results imply that the stacking fault energy (SFE) of γ matrix in TMS-238 is lower than that in MX-4. Higher additions of Re and Ru are responsible for the lower SFE in TMS-238.
Keywords :
Sixth generation , Ni-base superalloy , Stacking fault energy , Single crystal , Creep mechanism
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Serial Year :
2014
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Record number :
2176082
Link To Document :
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