• Title of article

    X-ray diffraction of samples irradiated by intensive atomic flows of low energy

  • Author/Authors

    Volosov، نويسنده , , V.I. and Tolochko، نويسنده , , B.P. and Churkin، نويسنده , , I.N.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    3
  • From page
    463
  • To page
    465
  • Abstract
    Experiments on the irradiation of titanium and niobium targets by flows of carbon atoms of low energy (〈W〉 ∼ 2.5 keV, j ∼ 50 mA/cm2) were made with a source of fast heavy atoms. Diagnostics of the irradiated samples was conducted by X-ray diffraction on the “anomalous scattering” station SR (the Budker INP). The measured thicknesses of the carbide layers (3.5 μm for TiC, 0.8 μm for Nb2C) show the possibility of a high effective implantation by low energy atomic flows.
  • Keywords
    X-ray diffraction , Low energy implantation , Intensive atomic flows
  • Journal title
    Nuclear Instruments and Methods in Physics Research Section A
  • Serial Year
    1998
  • Journal title
    Nuclear Instruments and Methods in Physics Research Section A
  • Record number

    2177458