Title of article
What is the real gas gain of a standard GEM?
Author/Authors
Bellazzini، نويسنده , , R. and Brez، نويسنده , , A. and Gariano، نويسنده , , G. and Latronico، نويسنده , , L. and Lumb، نويسنده , , N. and Spandre، نويسنده , , G. and Massai، نويسنده , , M.M. and Raffo، نويسنده , , R. and Spezziga، نويسنده , , M.A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
9
From page
429
To page
437
Abstract
We have observed very high gains (up to 7000) from GEMs with ‘standard’ parameters (kapton thickness 50 μm, pitch 120 μm, copper hole diameter 65 μm, kapton hole diameter 30 μm). This was achieved using GEMs coupled to a simple array of copper read-out strips. From the measurements of the current on all the electrodes, we conclude that the high observed gains are fully attributable to electron multiplication in the holes of the mesh, and not to electronics related effects as had been previously suggested. Furthermore, we report that this large gain may only be fully exploited when the field in the second GEM gap is high. The effect on the gain of coupling a GEM to another charge amplifying device was investigated using a GEM–PMGC combination.
Keywords
Kapton layer , Gas electron multiplier
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
1998
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2180175
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