Author/Authors :
Borrel، نويسنده , , V. and Kandel، نويسنده , , B. and Albernhe، نويسنده , , F. and Frabel، نويسنده , , P. and Cordier، نويسنده , , B. and Tauzin، نويسنده , , G. and Crespin، نويسنده , , S. and Coszach، نويسنده , , R. St-Denis، نويسنده , , J.M and Leleux، نويسنده , , P.، نويسنده ,
Abstract :
Several INTEGRAL n-type HPGe detectors have been irradiated by fast neutrons and their degradation studied through the analysis of line shapes. The availability of three different fast neutron beams (5, 16 and 6–70 MeV) allowed a quantitative analysis of the importance of the neutron energy on the amount of damage. A comparison is made with the degradation induced by high-energy proton irradiations. Transient effects on the measured resolution are reported after high voltage cut-off on degraded detectors.
