Intensity optimisation of a high-resolution ToF diffractometer

The analytical optimisation of a proposed high-resolution time-of-flight diffractometer in back scattering geometry will be shown. To obtain this aim we have formulated the resolution and the intensity in simple geometric parameters. The optimised configuration can be found analytically under the condition of a given resolution by the Lagrange multiplicator method. The equations for resolution and intensity have been compared with Monte Carlo simulation results.